The field of metrology is interesting for me as it integrates a lot of what I enjoy in physics and technology. The field from the outside seems very bland, but when you delve into the background, it becomes a more colorful picture. The field is reliant on the physics behind optics and image processing. These are areas of extreme interest to me. Visualization and capturing visualization data is essential for the field. A lot of this data is difficult to interact with as well because the data must be interpreted as a function that can be manipulated for reconstruction purposes from point cloud data. The mathematics behind this is what can be referred to a complex analysis. Today I will give some basic insight into these advanced concepts of physics and how they open us to learning more about metrology and 3D scanning. Let’s first talk about the field […]

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